Revolution in microscopy: New technology solves nanostructures at lightning speed!

Revolution in microscopy: New technology solves nanostructures at lightning speed!

Quanten, Deutschland - What's new in the world of microscopy and image processing? The technological innovations in these areas once again show that science turns a gear up. A particularly exciting topic is the further development of super-resolution (SR) image processing, which plays a role, especially in semiconductor technology and the examination of complex samples. An example of this is the C-Scan Sam (Scanning Acoustic Microscopy), which provides very promising results in data analysis. According to Nature , this technology is used in order to focus on acoustic pulses on sample material and thereby derive information about structures and defects.

The technology enables acoustic waves to be controlled so that high -resolution images are generated. The application for two samples that use different 3D integration technologies is particularly fascinating. The first sample consists of a fully metallized, unstructured silicon on a glass substrate, with an ion fold recess on the Wafer surface. The second sample comprises 10,240 Through-Silicon ViaS (TSVS), which are analyzed in detail with a ton burst arrangement. Targeted resolutions were chosen for imaging to maximize the efficiency of the data collection.

image quality and machine learning

Here the self -monitored learning comes into play! The researchers trained various ML-based SR architectures to further improve image quality. The goal is to overcome the time limits for high -resolution scans and at the same time deliver high -quality results. The use of metrics such as PSNR and SSIM shows that the CNN-based DCSCN model has the front in many applications. It even exceeds generative models such as SR-GAN and Indi.

Another exciting aspect of this technology is error analysis. The DCSCN model is applied to the eutectic wafer sample in order to increase segmentation accuracy. Various classes are analyzed here, including intact ties and delamed layers. Thanks to the DCSCN model, significant improvements have been achieved that are of great importance in practical use.

progress in microscopy

But not enough! Another important progress in microscopy is the marker-free super-resolution technique, which was recently presented by a team of researchers. This could revolutionize the investigation of complex samples because it does not require dyes or markings. As Analytica World is based on the new approach on the laser scanning-microscopy and enables it, To measure the light intensity and other light parameters precisely.

A central advantage of this method is your non-invasive nature. It could make a valuable contribution to gap filler technology between conventional microscopy and super-resolution techniques. In addition, the integration of artificial intelligence into image processing is being used, which could expand the possibilities of these new methods.

The progress in the areas of scanning acoustic microscopy and marking-free super-resolution show that we stand by the threshold of new knowledge. When we hear stories of acoustic waves and the analysis of nanostructures, it can be seen once again: The technology world is moving faster than ever!